Overview

Overview

The EZ530 Therm system (referred to throughout the source manual as the EZ-THERM Series / Eazy-THERM) is a benchtop, non-contact thermal imaging and analysis platform built around Thermoreflectance (TR) microscopy, with optional Infrared (IR) and Near-Infrared (NIR) imaging channels. It is a precision analysis tool for static (steady-state) and transient thermal imaging of active semiconductor devices, at scales ranging from millimeter down to micron/sub-micron.

What it measures: The system measures device surface temperature indirectly by detecting the relative change in optical reflectivity of a sample as its temperature changes (thermoreflectance), and/or by measuring infrared thermal emission (IR mode). It can simultaneously support up to three different sensors (Visible/TR, IR, and NIR/InGaAs).

Hardware family / platform notes (internal):

Major system components (per source Section 3, "System Description" — any system shipped to a customer includes):

  1. Optical Microscope
  2. Camera (Visible / IR / NIR / sCMOS / InGaAs, per configuration)
  3. Standard Rack Models
  4. Probe Station (Option)

Core software: The system is operated through SanjVIEW™ v7.0, embedded software running on the SanjCONTROLLER+ integrated desktop computer, which connects and manages all hardware modules. SanjVIEW 7 provides: Project Manager, Transient Thermoreflectance, Movie Mode, FA (Failure Analysis) Mode, Calibration, and SanjANALYZER™.


Revision #1
Created 2026-08-26 18:16:58 UTC by Accounts
Updated 2026-08-26 18:16:58 UTC by Accounts