Microsanj Test Sample

Sample Structure

The Microsanj test sample layer stack (from the source diagram): a SiO2 (200 nm) top layer; Au(130 nm)/Cr(5 nm) contact pads on either side; a SiO2 (300 nm) layer; a Si (n++) substrate core; and a SiO2 (300 nm) bottom layer. [diagram/image in source — not reproduced here]

Sample Layout and Equipment

Set Up Equipment:

NT220 Transient Thermoreflectance System
530 nm LED & 1064 nm LED
20X Objective Lens

Device Layout:

Device 1: 2 µm Au Point — Pins 1 & 2
Device 2: 5 µm x 500 µm Au line — Pins 12 & 15

[diagram/image in source — not reproduced here, showing physical pin layout for Device 1 and Device 2]

Project Manager

The Project Manager screen shows the Project Manager Controls alongside the current image of the sample. [diagram/image in source — not reproduced here]